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Services

Services
W. C. Heraeus is your partner for a complete solution. It is our endeavor to achieve constant improvement through close cooperation with our customers before, during and after the use of our products. For this we offer you the following services:
Engineering
For the nitric acid and cyanide industries Heraeus offers its partners engineering and technical support on an ad hoc basis. In addition Heraeus offers support to companies investing in new plants or revamping existing plants for all aspects concerning the oxidation reactor. These services are open to both end customers and to technology providers and plant manufacturers.
Reactor Optimization / Trouble Shooting
Heraeus Nitro Technologies conducts customer related studies on the optimization of process parameters and on possible causes of operational disruptions. Catalytic poisons, carbon layers or rhodium oxide deposits, which have been caused by anomalies in temperature, pressure or gas composition during service, as well as bulk material contamination can be identified quickly and thus be avoided in future operation.
Campaign Analyses

Heraeus offers a production campaign analysis service, whereby numerous operating and catalyst parameters are monitored and registered in a standardised data bank. Technical experts from Heraeus interpret the recorded data together with the plant operators in order to find solutions to reduce costs and increase plant efficiencies.

REM + EDX
The most commonly used technique for product development and customer support is Scanning Electron Microscopy (SEM) in conjunction with Energy Dispersive X-Ray Analysis (EDX). These methods enable a quick and reliable investigation of the morphology of the catalyst and the composition of surface contaminations on small scale samples.
Catalytic poisons, carbon layers or rhodium oxide deposits, which have been caused by anomalies in temperature, pressure or gas composition during service, as well as bulk material contaminations can be identified quickly and thus avoided in future operation.

AES, XPS + SIMS
In very demanding situations of product development and customer support techniques such as Auger Electron Spectrometry (AES), X-Ray Induced Photo Electron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS) can be used for local surface analysis and sub-surface profiling.
Thin contamination layers, rhodium oxide deposits and trace impurities, which can occur during operation and thus lower the efficiency of the catalysts can be analysed and identified reliably to optimise future operation parameters.

COHNS
Carbon, Oxygen, Hydrogen, Nitrogen and Sulphur (COHNS) contents can be determined by carrier gas hot extraction in our laboratory in the range of a few parts per million (ppm).
Thus, carbon or sulphur deposits, which have been caused by anomalies in temperature, pressure or gas composition during service, can be identified very precisely.

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